EXPERIENCE DRIVEN TECHNOLOGY
Benefits of Using Rika Denshi Probes – Attleboro, MA
Easy to modify probe specification:
Tip Shape, Length, Diameter, Spring Force, Material and Plating can be modified.
Support probe supply from small quantity to mass production
Support probe specification evaluation:
Cycle Test: Testing temperature can be changed from -40˚C to +200˚C
CCC Test: ~60A (DC and Pulse)
RF Test: Measurement up to 50GHz / Simulation up to 80GHz
Analysis Equipment: SEM / EDX, Xray, 3D measuring machine, load measuring, laser microscope and more.
Worldwide Support for all products
Production Test Sockets:
Sockets for all device and test applications
Sockets with various tip configurations can be built
Various plating options
Pitches down to 0.4mm and lower
Fine pitch down to 0.15mm
Spring Probes for:
Low-cost and short lead times
Fine Pitch for a Variety of Applications.
Fine Pitch Probes for WLCSP Applications
Spring Probes for Kelvin Applications
RF Spring Probes for up to 50GHz
Spring Probes for High Current and High Voltage
Spring Probes with a variety of hard plating(s)
Spring Probes for High Temps (+200˚C)
Homogeneous Spring Probes
Standard Pitch Spring Probes
Attleboro, MA